As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://plasticstoragebox45553.blogoscience.com/46089600/preparing-for-system-level-thinking-in-vlsi-design-education